The fifth IEEE Working Conference on Software Visualization (VISSOFT 2017) builds upon the success of the previous four editions of VISSOFT, which in turn followed after six editions of the IEEE International Workshop on Visualizing Software for Understanding and Analysis (VISSOFT) and five editions of the ACM Symposium on Software Visualization (SOFTVIS). In 2017, VISSOFT will again be co-located with ICSME in Shanghai, China.
Software visualization is a broad research area encompassing concepts, methods, tools, and techniques that assist in a range of software engineering and software development activities. Covered aspects include the development and evaluation of approaches for visually analyzing software and software systems, including their structure, execution behavior, and evolution.
The VISSOFT IEEE Working Conference on Software Visualization continues the history of the ACM SOFTVIS Symposium on Software Visualization and the IEEE VISSOFT International Workshop on Visualizing Software for Understanding and Analysis. The conference focuses on visualization techniques that target aspects of software maintenance and evolution, program comprehension, reverse engineering, and reengineering, i.e., how visualization helps professionals to understand, analyze, test and evolve software. We aim to gather tool developers, experts, users, and researchers from software engineering, information visualization, computer graphics, and human-computer interaction to discuss theoretical foundations, algorithms, techniques, tools, and applications related to software visualization. We seek technical papers, empirical studies, applications, or case studies and provide a platform for presenting novel research ideas and tools.
New this year: MIP award. This year’s VISSOFT will feature a Most Influential Paper award. This is the first such award given as part of the VISSOFT conference series. This year we will award a paper from one of VISSOFT 2002, VISSOFT 2003, and SOFTVIS 2003.
All dates refer to midnight 23:59:59 AoE.
|Main track (technical papers)||NIER and Tool tracks|
|Abstract Submission:||April 18, 2017|
|Paper Submission:||April 25, 2017||June 23, 2017|
|Author Response Period:||May 29 - June 2, 2017|
|Author Notification:||June 9, 2017||July 24, 2017|
|Artifact Submission for Accepted Papers:||June 25, 2017|
|Artifact Notification:||July 15, 2017|
|Conference Date:||September 18-19, 2017|